PRODUCT DETAILS
Sample Wafer Resistivity Inspection System
Sample Wafer Resistivity Inspection System
Product Introduction
This equipment is a four-probe resistivity detection and management system for samples in the semiconductor ingot production line, which can realize the automatic detection and classification management of resistivity, thickness, and P/N type of multi-specification samples, and the sample management is controllable.
Details show
劲旅环境
Product Introduction
This equipment is a four-probe resistivity detection and management system for samples in the semiconductor ingot production line, which can realize the automatic detection and classification management of resistivity, thickness, and P/N type of multi-specification samples, and the sample management is controllable.
Related Products
undefined
Product Equery
Address
No.1, Huake Street, Huayuan Industrial Park, Binhai High-tech Zone, Tianjin
Copyright©2023 Tianjin Huanbo Sci&Tech Co., LTD.