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Sample Wafer Resistivity Inspection System


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Sample Wafer Resistivity Inspection System

Product Introduction

This equipment is a four-probe resistivity detection and management system for samples in the semiconductor ingot  production line, which can realize the automatic detection and classification management of resistivity, thickness, and P/N type of multi-specification samples, and the sample management is controllable.

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Product Introduction

This equipment is a four-probe resistivity detection and management system for samples in the semiconductor ingot  production line, which can realize the automatic detection and classification management of resistivity, thickness, and P/N type of multi-specification samples, and the sample management is controllable.

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Tianjin Huanbo Sci&Tech Co., LTD.

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