The system is used in the crystal inspection process in the production of semiconductor crystal growth, and realizes the automation of the whole process of automatic loading and unloading of the truncation/rolling process, automatic crystal inspection, cache storage, palletizing and packaging, etc.

This equipment is a four-probe resistivity detection and sorting equipment for cutting and grinding wafers in the semiconductor polishing wafer production line, which can realize the automatic detection and sorting of resistivity, thickness, and P/N type of multiple specifications of wafers.

This equipment is a four-probe resistivity detection and management system for samples in the semiconductor ingot  production line, which can realize the automatic detection and classification management of resistivity, thickness, and P/N type of multi-specification samples, and the sample management is controllable.

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